Stanciu, S. G., Anton, S. R., Tranca, D. E., Stanciu, G. A., Ionescu, B., Zalevsky, Z., Kusnetz, B., Belhassen, J., Karsenty, A., & Cincotti, G. (2025). Inferring scattering-type Scanning Near-Field Optical Microscopy Data from Atomic Force Microscopy Images. arXiv preprint arXiv:2504.02982 (Currently under peer review)